Technical Specifications

For technical specifications please refer to the data sheet.

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Cryocsan

Watch the video to get an impression of the operating principle and handling of the instrument.

HTS - film quality assessment

For fast routine characterization of  large HTS films, THEVA has developed the Cryoscan^TM. The instrument performs non-destructive mapping of the critical current density on HTS wafers using an inductive technique.

It offers accurate measurements of the overall film quality as well as two-dimensional, high-resolution maps of the critical current distribution.

Combined with an optional accessory, the instrument also allows determination of the film transition temperature of single and double- sided coated wafers.

Measurement principle

The mapping of the critical current density is possible by an inductive non-contact technique. A field coil applies a sinusoidal AC-field with increasing amplitude.

Screening currents are induced within the superconductor (Lenz rule). If these exceed the critical current, the screening effect is reduced in the peaks and the sine signal distorted. The Cryoscan can detect this distortion as a function of the current amplitude and determines the local critical current density within the film.